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Thermo- and galvanomagnetic measurements of semiconductors at ultrahigh pressure

机译:超高压下半导体的热磁和电磁测量

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The thermoelectric power, magnetoresistance, and thermomagnetic effects were measured for Te and Se micro-samples in the vicinity of semiconductor-metal phase transitions at high pressure. From longitudinal and transverse Nernst-Ettingshausen effects the scattering parameter r of holes was estimated and a decrease of the effective mass of holes was found during the closing of semiconductor gap. After the high pressure treatment an inversion of the sign of parameter r corresponding to a change of scattering mechanism was observed for the Te sample due to an increase of the density of lattice defects. [References: 21]
机译:在高压下,在半导体-金属相变附近,对Te和Se微型样品测量了热电功率,磁阻和热磁效应。从Nernst-Ettingshausen的纵向和横向效应,可以估算出空穴的散射参数r,并且在闭合半导体间隙期间发现了空穴的有效质量下降。在高压处理之后,由于晶格缺陷密度的增加,对于Te样品观察到参数r的符号反转,其对应于散射机制的变化。 [参考:21]

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