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Simulations of tensile fracture in thin films bonded to solid substrates

机译:粘合到固体基材上的薄膜中拉伸断裂的模拟

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We perform simulations of crack growth in a brittle-elastic two-dimensional film bonded to a rigid substrate and subject to isotropic tensile stress. The motion of the film sites is dissipative and we consider both purely dissipative dynamics and dynamics with finite dissipation. In both cases, we find a threshold stress for crack growth below which the lattice is stable against further breaking. Effective fractal dimensions are computed for crack clusters nucleated by a single defect in an otherwise undamaged lattice with both finite and infinite dissipation. When the dissipation is infinite, the crack clusters have asymptotic fractal dimensions of 2.0 and exhibit a cross-over from a fractal dimension of 1.0 to a fractal dimension of 2.0 as the stress in the lattice is increased from the threshold. When the dissipation is finite, all crack clusters grown with stress equal to or greater than the threshold stress have fractal dimensions of 2.0. These results contrast with those found in crack models which employ stochastic breaking rules. We argue that the inclusion of a realistically modelled substrate leads to the compact crack clusters that we find in our simulations.
机译:我们在粘合到刚性基材并承受各向同性拉伸应力的脆性二维弹性膜中执行裂纹扩展的模拟。胶片位置的运动是耗散的,我们既考虑纯耗散动力学,也考虑有限耗散的动力学。在这两种情况下,我们都发现了裂纹扩展的阈值应力,低于该阈值时晶格稳定,不会进一步断裂。计算由单个缺陷成核的裂纹团簇的有效分形维数,而该裂纹簇在其他情况下未损坏且具有有限和无限耗散的晶格。当耗散为无穷大时,随着晶格中的应力从阈值增加,裂纹簇的渐近分形维数为2.0,并呈现出从1.0的分形维数到2.0的分形维数的交点。当耗散有限时,所有应力等于或大于阈值应力的裂纹簇的分形维数均为2.0。这些结果与在采用随机破坏规则的裂纹模型中发现的结果相反。我们认为,包含真实建模的基底会导致我们在模拟中找到紧凑的裂纹簇。

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