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Proposed explanation of the anomalous doping characteristics of III-V nitrides

机译:关于III-V氮化物异常掺杂特性的拟议解释

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Anomalous doping characteristics of III-V nitrides are explained on the basis df experimental methods. To our knowledge, this is the first successful experimental attempt to address the doping difficulties with the p- and n-type III-V nitrides. GaN is used as the test system. Our results strongly suggest that N vacancies (V-N), creating donor-like states at or very near the conduction-band edge, are responsible for natural n-type doping characteristics of undoped samples. The samples cannot be doped p type even by introducing a large content of p-type dopant atoms, unless the natural n-type character is nullified by minimizing the presence of V-N. This can be done by increasing the ammonia flow rate significantly during epitaxial growth. However, excessive flow of ammonia leads to the generation of donor-like N antisites. Compensation of holes of the acceptor states by electrons of these donor-like states, and the high binding energy of the acceptor atoms hinder the realization of high p-type doping.
机译:在实验方法的基础上解释了III-V族氮化物的异常掺杂特性。据我们所知,这是解决p型和n型III-V氮化物掺杂困难的第一个成功的实验尝试。 GaN被用作测试系统。我们的结果强烈表明,N个空位(V-N)在导带边缘处或附近产生了类似供体的态,这是未掺杂样品的自然n型掺杂特性的原因。除非通过引入大量的p型掺杂原子,否则无法将样品掺杂为p型,除非通过最小化V-N的存在使自然的n型特征无效。这可以通过在外延生长期间显着增加氨的流速来完成。然而,氨的过量流动导致产生供体样N反位点。这些供体态的电子对受体态的空穴进行补偿,并且受体原子的高结合能阻碍了高p型掺杂的实现。

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