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首页> 外文期刊>Physics in medicine and biology. >Noise analysis in fast magnetic resonance electrical impedance tomography (MREIT) based on spoiled multi gradient echo (SPMGE) pulse sequence
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Noise analysis in fast magnetic resonance electrical impedance tomography (MREIT) based on spoiled multi gradient echo (SPMGE) pulse sequence

机译:基于损坏的多梯度回波(SPMGE)脉冲序列的快速磁共振电阻抗层析成像(MREIT)中的噪声分析

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Magnetic resonance electrical impedance tomography (MREIT) is a promising non-invasive method to visualize a static cross-sectional conductivity and/or current density image by injecting low frequency currents. MREIT measures one component of the magnetic flux density caused by the injected current using a magnetic resonance (MR) scanner. For practical in vivo implementations of MREIT, especially for soft biological tissues where the MR signal rapidly decays, it is crucial to develop a technique for optimizing the magnetic flux density signal by the injected current while maintaining spatial-resolution and contrast. We design an MREIT pulse sequence by applying a spoiled multi-gradient-echo pulse sequence (SPMGE) to the injected current nonlinear encoding (ICNE), which fully injects the current at the end of the read-out gradient. The applied ICNE-SPMGE pulse sequence maximizes the duration of injected current almost up to a repetition time by measuring multiple magnetic flux density data. We analyze the noise level of measured magnetic flux density with respect to the pulse width of injection current and T2 * relaxation time. In due consideration of the ICNE-SPMGE pulse sequence, using a reference information of T2 * values in a local region of interest by a short pre-scan data, we predict the noise level of magnetic flux density to be measured for arbitrary repetition time TR. Results from phantom experiment demonstrate that the proposed method can predict the noise level of magnetic flux density for an appropriate TR=40ms using a reference scan for TR=75ms. The predicted noise level was compared with the noise level of directly measured magnetic flux density data.
机译:磁共振电阻抗断层扫描(MREIT)是一种有前途的无创方法,可通过注入低频电流来可视化静态截面电导率和/或电流密度图像。 MREIT使用磁共振(MR)扫描仪测量由注入电流引起的磁通密度的一个分量。对于MREIT的实际体内实施,特别是对于MR信号迅速衰减的软生物组织,开发一种通过注入电流优化磁通量密度信号同时保持空间分辨率和对比度的技术至关重要。我们通过将损坏的多梯度回波脉冲序列(SPMGE)应用于注入电流非线性编码(ICNE),设计MREIT脉冲序列,该序列在读出梯度的末尾完全注入电流。通过测量多个磁通量密度数据,所施加的ICNE-SPMGE脉冲序列可将注入电流的持续时间最大化,直至重复时间。我们分析了相对于注入电流的脉冲宽度和T2 *弛豫时间测得的磁通密度的噪声水平。在适当考虑了ICNE-SPMGE脉冲序列的情况下,通过短预扫描数据,使用感兴趣区域中T2 *值的参考信息,我们可以预测任意重复时间TR所要测量的磁通密度的噪声水平。幻像实验的结果表明,所提出的方法可以使用参考扫描TR = 75ms来预测适当TR = 40ms的磁通密度的噪声水平。将预测的噪声水平与直接测量的磁通密度数据的噪声水平进行比较。

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