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首页> 外文期刊>Pattern Recognition: The Journal of the Pattern Recognition Society >Improved learning of I2C distance and accelerating the neighborhood search for image classification
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Improved learning of I2C distance and accelerating the neighborhood search for image classification

机译:改善了I2C距离的学习并加快了邻域搜索以进行图像分类

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摘要

Image-to-class (I2C) distance is a novel measure for image classification and has successfully handled datasets with large intra-class variances. However, due to the lack of a training phase, the performance of this distance is easily affected by irrelevant local features that may hurt the classification accuracy. Besides, the success of this I2C distance relies heavily on the large number of local features in the training set, which requires expensive computation cost for classifying test images. On the other hand, if there are small number of local features in the training set, it may result in poor performance. In this paper, we propose a distance learning method to improve the classification accuracy of this I2C distance as well as two strategies for accelerating its NN search. We first propose a large margin optimization framework to learn the I2C distance function, which is modeled as a weighted combination of the distance from every local feature in an image to its nearest-neighbor (NN) in a candidate class. We learn these weights associated with local features in the training set by constraining the optimization such that the I2C distance from image to its belonging class should be less than that to any other class. We evaluate the proposed method on several publicly available image datasets and show that the performance of I2C distance for classification can significantly be improved by learning a weighted I2C distance function. To improve the computation cost, we also propose two methods based on spatial division and hubness score to accelerate the NN search, which is able to largely reduce the on-line testing time while still preserving or even achieving a better classification accuracy.
机译:图像到类(I2C)距离是一种用于图像分类的新颖度量,并且已成功处理了具有较大类内差异的数据集。但是,由于缺少训练阶段,此距离的性能容易受到不相关的局部特征的影响,这些特征可能会损害分类精度。此外,此I2C距离的成功很大程度上取决于训练集中的大量局部特征,这需要昂贵的计算成本来对测试图像进​​行分类。另一方面,如果训练集中的局部特征数量很少,则可能会导致性能不佳。在本文中,我们提出了一种远程学习方法来提高此I2C距离的分类精度,并提出了两种加速其NN搜索的策略。我们首先提出一个大的余量优化框架来学习I2C距离函数,该函数建模为候选类中图像中每个局部特征到其最近邻居(NN)的距离的加权组合。我们通过约束优化来学习与训练集中的局部特征相关的这些权重,以使从图像到其所属类的I2C距离应小于对任何其他类的I2C距离。我们在几个公开可用的图像数据集上评估了该方法,结果表明,通过学习加权I2C距离函数,可以显着改善I2C距离的分类性能。为了提高计算成本,我们还提出了两种基于空间划分和中心度评分的方法来加速NN搜索,该方法能够在很大程度上保留在线测试时间的同时,仍保留甚至达到更好的分类精度。

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