Learning prototypes and distances: A prototype reduction technique based on nearest neighbor error minimization

摘要

A prototype reduction algorithm is proposed, which simultaneously trains both a reduced set of prototypes and a suitable local metric for these prototypes. Starting with an initial selection of a small number of prototypes, it iteratively adjusts both the position (features) of these prototypes and the corresponding local-metric weights. The resulting prototypes/metric combination minimizes a suitable estimation of the classification error probability. Good performance of this algorithm is assessed through experiments with a number of benchmark data sets and with a real task consisting in the verification of images of human faces. (c) 2005 Pattern Recognition Society. Published by Elsevier Ltd. All rights reserved.