...
首页> 外文期刊>Opto-electronics review >Fourier optics approach to imaging with sub-wavelength resolution through metal-dielectric multilayers
【24h】

Fourier optics approach to imaging with sub-wavelength resolution through metal-dielectric multilayers

机译:傅里叶光学方法通过金属介电多层膜以亚波长分辨率成像

获取原文
获取原文并翻译 | 示例
           

摘要

Metal-dielectric layered stacks for imaging with sub-wavelength resolution are regarded as linear isoplanatic systems - a concept popular in Fourier optics and in scalar diffraction theory. In this context, a layered flat lens is a one-dimensional spatial filter characterised by the point spread function. However, depending on the model of the source, the definition of the point spread function for multilayers with sub-wavelength resolution may be formulated in several ways. Here, a distinction is made between a soft source and hard electric or magnetic sources. Each of these definitions leads to a different meaning of perfect imaging. It is shown that some simple interpretations of the PSF, such as the relation of its width to the resolution of the imaging system are ambiguous for the multilayers with sub-wavelenth resolution. These differences must be observed in point spread function engineering of layered systems with sub-wavelength sized PSF.
机译:用于亚波长分辨率成像的金属介电层堆叠被视为线性等平面系统-在Fourier光学和标量衍射理论中很流行的概念。在本文中,分层平面透镜是特征在于点扩散函数的一维空间滤光器。但是,取决于光源的模型,具有亚波长分辨率的多层的点扩展函数的定义可以用几种方式来表述。在此,在软源与硬电或磁源之间进行区分。这些定义中的每一个都导致完美成像的不同含义。结果表明,对于具有亚波长分辨率的多层膜,PSF的一些简单解释(例如其宽度与成像系统分辨率的关系)是模棱两可的。这些差异必须在具有亚波长尺寸PSF的分层系统的点扩展函数工程中观察到。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号