首页> 外文期刊>PACE: Pacing and clinical electrophysiology >Transvenous cardioverter defibrillator lead malfunction due to terminal connector damage in pectoral implants.
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Transvenous cardioverter defibrillator lead malfunction due to terminal connector damage in pectoral implants.

机译:由于胸腔植入物的终端连接器损坏,导致静脉心脏复律除颤器导线故障。

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Lead failure places patients with implantable cardioverter defibrillators (ICD) at risk for sudden cardiac death or results in delivery of inappropriate shocks. This study describes a mechanism of lead malfunction occurring at the junction of the terminal ring with the conductor coil of the rate sensing terminal connector in one specific model of a transvenous ICD lead. We detected the problem in a population of 179 patients with a mean age of 61 +/- 10 years and a mean lead implant duration of 16 +/- 11 months. All patients underwent pectoral ICD implantation using a submuscular approach. The implanting physician chose to place the ICD on the left side in 155 patients (87%) and on the right side in 24 patients (13%). Cephalic vein cutdown provided central venous access in 147 patients (82%), and subclavian vein puncture provided access in 32 patients (18%). Follow-up examination detected lead failure in six patients (3.5% over 31 months) due to insulation damage with or without conductor coil fracture at the junction of the terminal ring and conductor coil of the IS-1 rate sense terminal. We detected lead disruption 17 +/- 9 months (range 5-31 months) after implantation. Multiple nonsustained arrhythmia episodes exhibiting nonphysiologic intervals associated with noisy rate sensing electrograms during pocket manipulation led to discovery in three patients. The other three patients presented with inappropriate device discharges confirmed by stored high-energy lead electrograms showing normal rhythm. Pacing lead impedance abnormally dropped in two patients. Impedance remained stable in the other four patients. In conclusion, the generator pocket represents an important site of ICD transvenous lead vulnerability. Lead failure may result from conductor coil and/or insulation disruption at the interface with the rate sensing terminal connector.
机译:导联衰竭使具有植入式心脏复律除颤器(ICD)的患者面临心脏猝死或导致不适当地电击的危险。这项研究描述了一种在静脉ICD导线的特定模型中,在端子环与速率传感端子连接器的导体线圈的连接处发生导线故障的机制。我们在平均年龄为61 +/- 10岁,平均铅植入持续时间为16 +/- 11个月的179名患者中检测到该问题。所有患者均采用肌下方法进行胸腔ICD植入。植入医师选择将ICD放置在155例患者(87%)的左侧,而放置在24例患者(13%)的右侧。颈静脉切开术可提供147例患者的中心静脉通路(82%),锁骨下静脉穿刺术可提供32例患者的通路(18%)。随访检查发现有6位患者(31个月内为3.5%)由于绝缘损坏而导致导线失效,无论是否在IS-1速率感测端子的端子环和导体线圈的连接处出现导体线圈断裂。植入后17 +/- 9个月(范围5-31个月),我们检测到铅破坏。多次非持续性心律失常发作在口袋操作期间表现出与噪声速率感应电描记图相关的非生理间隔,导致三名患者被发现。其他三名患者出现了不适当的器械放电,这是通过存储的高能量铅电描记图证实了节律正常所证实的。两名患者的起搏导线阻抗异常下降。其他四名患者的阻抗保持稳定。总之,发生器袋代表ICD静脉铅易损的重要部位。导线故障可能是由于导体线圈和/或与速率感应端子连接器的接口处的绝缘破坏引起的。

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