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Optimization of high frequency flip-chip interconnects for digital superconducting circuits

机译:优化数字超导电路的高频倒装芯片互连

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This paper presents the results of theoretical optimization of the multi-chip-module (MCM) contact and driver circuitries for gigabit chip-to-chip communication. Optimization has been done using 3D electromagnetic (EM) simulations of MCM contacts and time domain simulations of drivers and receivers. A single optimized MCM contact has a signal reflection of less than -20 dB for more than 400 GHz bandwidth. The MCM data link with the optimized SFQ driver, receiver and two MCM contacts has operational margins on the global bias current of +/- 30% at 30 Gbit s(-1) speed and can operate above 100 Gbit s(-1) speed. Wide bandwidth transmission requires the realization of an advanced flip-chip process with a small dimension of the MCM contact (less than 30 mu m diameter of the contact pad) and small height of the flip-chip contact bumps of the order of 2 mu m. Current processes with about 7 mu m height of the bumps require the application of a double-flux-quantum (DFQ) driver. The data link with the DFQ driver was also simulated. It has operational margins on the global bias current of +/- 30% at 30 Gbit s(-1); however, themaximum speed of operation is 61 Gbit s(-1). Several test structures have been designed for measurements of signal reflection, bit error rate and operational margins of the data link.
机译:本文介绍了用于千兆位芯片到芯片通信的多芯片模块(MCM)触点和驱动器电路的理论优化结果。使用MCM触点的3D电磁(EM)模拟以及驱动器和接收器的时域模拟已经完成了优化。对于超过400 GHz的带宽,单个优化的MCM触点的信号反射小于-20 dB。具有优化的SFQ驱动器,接收器和两个MCM触点的MCM数据链路在30 Gbit s(-1)速度下的全局偏置电流上具有+/- 30%的操作裕度,并且可以在100 Gbit s(-1)速度以上运行。宽带传输需要实现一种先进的倒装芯片工艺,其MCM触点尺寸小(接触垫的直径小于30微米),倒装芯片触点凸点的高度小至2微米左右。当前的凸点高度约为7μm的工艺需要使用双磁通量子(DFQ)驱动器。还模拟了与DFQ驱动程序的数据链接。它在30 Gbit s(-1)时的全局偏置电流上具有+/- 30%的操作裕度;但是,最大操作速度为61 Gbit s(-1)。设计了几种测试结构,用于测量信号反射,误码率和数据链路的操作余量。

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