Application of DAF Technology to Find Potential Markers Associated with Resistance to Soybean Cyst Nematode, Race 3

摘要

Soybean cyst nematode (SCN, Heterodera glycines Ichimohe) is the leading pest causing economic losses of soybean yields in the USA. It was first found in North Carolina in 1954 (Winstead et al., 1955); and has subsequently been reported in most soybean producing states of the USA. It has been estimated that the combined yield losses from SCN in 28 soybean producing states during the years 1988-1991 was approximately 800 million dollar per year (Doupnik, 1993; Sciumbato, 1993). Chemical control of SCNhas been widely used, but may cause environmental pollution when used extensively. Crop rotation is another effective way to manage nematode populations in infested soil; however, cultivation for one season of a susceptible cultivar can result in resurgence of the nematode population. The development of resistant cultivars is a high priority in many public and private soybean breeding programs, and the use of such cultivars is an effective approach to reduce soil populations and damage from SCN. Many existing cultivars with resistance suffer from yield depression. The techniques to identify resistant versus susceptible genotypes is time- and labor -consuming and imprecise. Identification and characterization of new resistance genes in soybean by molecular methods will play an important role in introgressing these genes into new cultivars (Webb et al., 1995; Concibido et al., 1994).We are using DNA amplification fingerprinting (DAF) to identify resistance gene(s) associated with Race 3 of SCN in soybean.