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Determination of trace elements in high-purity palladium by inductively coupled plasma mass spectrometry using an internal standard method

机译:内标法电感耦合等离子体质谱法测定高纯钯中的痕量元素

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Method validation of inductively coupled plasma mass spectrometry analyses for trace impurities in high-purity materials is often limited not only by the lack of suitable reference materials with the same matrix composition but also by the lack of a significant number of certified trace element concentrations in the available reference materials. This paper demonstrates a new and simple method for the direct determination of 44 trace elements in high-purity palladium using inductively coupled plasma mass spectrometry and an internal standard method. Sc and In were employed as internal standards to effectively eliminate nonspectral interferences from the Pd matrix. The detection limits of the 44 trace impurities were from 0.00078 to 0.46 mu g/mL and the relative standard deviations (n = 6) were below 3.5%. The method was further validated using a palladium standard material ( Aldrich palladium standard material, CAS no. 7440053). The analytical results are in good agreement with the certified values.
机译:高纯度材料中痕量杂质的电感耦合等离子体质谱分析方法的验证通常不仅受到缺乏具有相同基质组成的合适参考物质的限制,而且还由于缺乏足够的经认证的痕量元素浓度而受到限制。可用参考资料。本文展示了一种使用电感耦合等离子体质谱法和内标法直接测定高纯钯中44种微量元素的新方法。 Sc和In被用作内部标准,以有效消除Pd矩阵的非光谱干扰。 44种微量杂质的检出限为0.00078至0.46μg / mL,相对标准偏差(n = 6)低于3.5%。使用钯标准材料(Aldrich钯标准材料,CAS号7440053)进一步验证了该方法。分析结果与认证值高度吻合。

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