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A Photoelastic Study of T-stress in Centrally Cracked Brazilian Disc Specimen Under Mode II Loading

机译:II型载荷下巴西中央盘试样中T应力的光弹性研究

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摘要

In the traditional formulation of the stress field near a crack tip, the presence of the T-stress is generally considered only under model or mixed model and II conditions. In this paper its presence in almost pure Mode II is experimentally investigated by mean of photoelasticity and its effects on the isochromatic fringe patterns are discussed. The test specimens are Brazilian discs containing sharp central cracks. After crack generation, all residual stresses are removed with thermal treatment of the specimens. Then, a compressive load is applied in a specific angle to induce mode II deformation. The observed isochromatic fringes show very good consistency with theoretical predictions. Experimental results indicate that this specimen has a negative T-stress in mode II condition. The results calculated for K_(II) and T from photoelastic experiments agree well with numerical results available from finite element method.
机译:在裂纹尖端附近的传统应力场公式中,通常仅在模型或混合模型以及II条件下考虑T应力的存在。在本文中,通过光弹性实验研究了其在几乎纯的模式II中的存在,并讨论了其对等色条纹图案的影响。试样是巴西圆盘,上面有尖锐的中央裂纹。产生裂纹后,通过热处理对所有残余应力进行去除。然后,以特定角度施加压缩载荷以引起模式II变形。观察到的等色条纹显示出与理论预测非常好的一致性。实验结果表明,该样品在II型条件下具有负T应力。通过光弹性实验计算的K_(II)和T的结果与有限元方法可获得的数值结果非常吻合。

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