On large deviations in testing Ornstein–Uhlenbeck-type models

摘要

We obtain exact large deviation rates for the log-likelihood ratio in testing models with observed Ornstein–Uhlenbeck processes and get explicit rates of decrease for the error probabilities of Neyman–Pearson, Bayes, and minimax tests. Moreover, we give expressions for the rates of decrease for the error probabilities of Neyman–Pearson tests in models with observed processes solving affine stochastic delay differential equations.