Characterization of trace elements in high viscosity materials by total reflection X-ray spectrometry

摘要

This paper proposes the use of radiation scattered by the sample instead of the internal standard method for quantifying impurities in high viscosity materials using X-ray fluorescence with total reflection geometry. The method his been performed for checking trace elements in gels of polymers. Advantages include no sample preparation and a minimum amount of sample (10 #mu#1). The method is also insensitive to instrumental variations, sample amount and particle size of the sample. The ratio of coherent to incoherent scattering intensities of X-ray was also investigated to estimate the content of C plus O in these polymers.