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The grain boundary impedance of random microstructures: numerical simulations and implications for the analysis of experimental data

机译:随机微结构的晶界阻抗:数值模拟及其对实验数据分析的启示

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The grain boundary impedance of polycrystalline materials is usually analyzed in terms of a simplified microstructure composed of cubic-shaped grains. In order to investigate the validity of such a "brick layer model", impedance spectra of polycrystals with computer-generated microstructures (two-dimensional Voronoi diagrams) have been simulated. These calculations showed that the current density in polycrystals can be rather inhomogeneous and that the so-called grain boundary impedance depends on the bulk conductivity. Nevertheless, the corresponding grain boundary resistances, capacitances and relaxation frequencies are frequently close to the values expected from a brick layer model. The impact of these calculations on the analysis of grain boundary impedances caused by space charge depletion layers is discussed. It is shown in how far impedance parameters yield reliable space charge potentials. Measurements on polycrystalline SrTiO3 illustrate the suggested approach. In the quantitative analysis of these experiments, capacitances have been calculated from constant phase elements. (C) 2002 Elsevier Science B.V. All rights reserved. [References: 37]
机译:多晶材料的晶界阻抗通常是根据由立方晶粒组成的简化微观结构来分析的。为了研究这种“砖层模型”的有效性,已对具有计算机生成的微结构(二维Voronoi图)的多晶体的阻抗谱进行了模拟。这些计算表明,多晶中的电流密度可能相当不均匀,并且所谓的晶界阻抗取决于体导电率。然而,相应的晶界电阻,电容和弛豫频率通常接近于砖层模型所期望的值。讨论了这些计算对空间电荷耗尽层引起的晶界阻抗分析的影响。它显示了阻抗参数产生可靠的空间电荷电位的程度。在多晶SrTiO3上的测量说明了建议的方法。在这些实验的定量分析中,已从恒定相位元素计算出电容。 (C)2002 Elsevier Science B.V.保留所有权利。 [参考:37]

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