首页> 外文期刊>Solar physics >Resolving Differences in Absolute Irradiance Measurements Between the SOHO/CELIAS/SEM and the SDO/EVE
【24h】

Resolving Differences in Absolute Irradiance Measurements Between the SOHO/CELIAS/SEM and the SDO/EVE

机译:解决SOHO / CELIAS / SEM与SDO / EVE之间的绝对辐照度测量差异

获取原文
获取原文并翻译 | 示例
           

摘要

The Solar EUV Monitor (SEM) onboard SOHO has measured absolute extreme ultraviolet (EUV) and soft X-ray solar irradiance nearly continuously since January 1996. The EUV Variability Experiment (EVE) on SDO, in operation since April of 2010, measures solar irradiance in a wide spectral range that encompasses the band passes (26 – 34 nm and 0.1 – 50 nm) measured by SOHO/SEM. However, throughout the mission overlap, irradiance values from these two instruments have differed by more than the combined stated uncertainties of the measurements. In an effort to identify the sources of these differences and eliminate them, we investigate in this work the effect of reprocessing the SEM data using a more accurate SEM response function (obtained from synchrotron measurements with a SEM sounding-rocket clone instrument taken after SOHO was already in orbit) and timedependent, measured solar spectral distributions – i.e., solar reference spectra that were unavailable prior to the launch of the SDO.We find that recalculating the SEM data with these improved parameters reduces mean differences with the EVE measurements from about 20 % to less than 5 % in the 26 – 34 nm band, and from about 35 % to about 15 % for irradiances in the 0.1 – 7 nm band extracted from the SEM 0.1 – 50 nm channel.
机译:自1996年1月以来,SOHO上的Solar EUV Monitor(SEM)几乎连续测量了绝对极紫外(EUV)和软X射线太阳辐照度。SDO上的EUV可变性实验(EVE)自2010年4月开始运行,用于测量太阳辐照度SOHO / SEM测量的光谱范围很广,包括带通(26 – 34 nm和0.1 – 50 nm)。但是,在整个任务重叠期间,这两种仪器的辐照度值相差的幅度超过了测量的综合不确定性。为了找出这些差异的根源并消除它们,我们在这项工作中研究了使用更准确的SEM响应函数(从在SOHO探测后使用SEM探空火箭克隆仪进行同步加速器测量获得的结果)对SEM数据进行再处理的效果。已进入轨道)和随时间变化的已测量太阳光谱分布-即在SDO发射之前无法获得的太阳参考光谱。我们发现,使用这些改进的参数重新计算SEM数据可将EVE测量值的平均差异降低约20%在26 – 34 nm波段中小于5%,对于从SEM 0.1 – 50 nm通道中提取的0.1 – 7 nm波段中的辐照度,从大约35%到大约15%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号