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首页> 外文期刊>Solar Energy Materials and Solar Cells: An International Journal Devoted to Photovoltaic, Photothermal, and Photochemical Solar Energy Conversion >Optical response of deep defects as revealed by transient photocapacitance and photocurrent spectroscopy in CdTe/CdS solar cells
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Optical response of deep defects as revealed by transient photocapacitance and photocurrent spectroscopy in CdTe/CdS solar cells

机译:CdTe / CdS太阳能电池中瞬态光电容和光电流光谱显示的深层缺陷的光学响应

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摘要

Transient photocapacitance (TPC) and photocurrent (TPI) spectroscopy were used to characterize defects in CdTe/CdS solar cells. A broad defect band is observed at an optical energy of 1.28 eV above the valence band, and such a defect is not indicated by admittance spectroscopy and drive-level capacitance profiling. Temperature-dependent TPC measurements of the defect band follow a thermal quenching model in which the defect's energy, 0.22 eV below the conduction band, is consistent with the optical response. We provide a theoretical basis for the use of a thermal quenching model in TPC.
机译:瞬态光电容(TPC)和光电流(TPI)光谱用于表征CdTe / CdS太阳能电池中的缺陷。在价带上方1.28 eV的光能处观察到较宽的缺陷带,并且这种缺陷无法通过导纳光谱法和驱动级电容分析来指示。缺陷带的温度相关TPC测量遵循热猝灭模型,其中缺陷的能量(比导带低0.22 eV)与光学响应一致。我们为在TPC中使用热淬火模型提供了理论基础。

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