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Development of high-efficiency thin-film Si solar cells using zone-melting recrystallization

机译:利用区域熔化再结晶技术开发高效薄膜硅太阳能电池

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摘要

The Via-hole Etching for the Separation of Thin films (VEST) process has been developed based on SOI technology of zone-melting recrystallization (ZMR). In order to obtain high-quality thin-film polycrystalline Si, it was found that the thickness of recrystallized Si film is an important factor. On the other hand, we have newly investigated the module process for the VEST cells. As a result, we have achieved 13.1% efficiency (V-oc: 5.257 V, I-sc: 3.43 A, FF:0.6695) with a module size of 924.2cm(2). (C) 2001 Elsevier Science B.V. All rights reserved. [References: 10]
机译:基于区域熔融重结晶(ZMR)的SOI技术,开发了用于薄膜分离(VEST)工艺的通孔蚀刻。为了获得高质量的薄膜多晶硅,发现重结晶的硅膜的厚度是重要的因素。另一方面,我们新近研究了VEST单元的模块过程。结果,我们实现了13.1%的效率(V-oc:5.257 V,I-sc:3.43 A,FF:0.6695),模块尺寸为924.2cm(2)。 (C)2001 Elsevier Science B.V.保留所有权利。 [参考:10]

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