Mechanical Assisted Corrosion: An Investigation of Thin Film Components used in Flexible Optoelectronic Applications

摘要

During flexible optoelectronic device packaging, acid containing layers initiate the functional failure of the underlying indium tin oxide film. We experimentally investigate the stress-assisted corrosion cracking of thin conductive optoelectronic components. It is essential to understand the stress corrosion mechanisms in order to design highly durable flexible electronic structures.