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Recovery of phosphoric acid from mixed waste acids of semiconductor industry by diffusion dialysis and vacuum distillation

机译:通过扩散渗析和真空蒸馏从半导体工业的混合废酸中回收磷酸

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摘要

Etching processes during the production of semiconductors generate mixed waste acids containing acetic acid (HAc), nitric acid (HNO3) and phosphoric acid (H3PO4) with aluminum (Al) and/or molybdenum (Mo) as impurities. Diffusion dialysis with newly developed anion exchange membrane method followed by vacuum distillation was carried out to recover phosphoric acid from mixed waste acids. Experiments examined dialyzer performance under different operating conditions of various inlet acid and water flow rates, phosphoric acid and Al concentrations in the feed solution, and operational temperature. The recovered H3PO4 in this process was found to be 85 wt.% whereas the concentration of Al leakage was of 3.68 mg/kg. Although, diffusion dialysis was very effective for this purpose, it failed to achieve the multi-target of more than 80% H3PO4 recovery yield with 50% acid concentration and less than 1 mg Al/kg of 85% H3PO4 simultaneously. Complete separation of HNO3 and HAc from H3PO4 was achieved using vacuum distillation at 730 mm Hg vacuum pressure and 125 °C temperature.
机译:半导体生产过程中的蚀刻过程会产生混合废酸,其中含有乙酸(HAc),硝酸(HNO3)和磷酸(H3PO4),而铝(Al)和/或钼(Mo)为杂质。使用新开发的阴离子交换膜方法进行渗析,然后进行真空蒸馏,以从混合废酸中回收磷酸。实验检查了透析器在不同的操作条件下的性能,这些条件包括各种入口酸和水流速,进料溶液中的磷酸和Al浓度以及操作温度。发现在该过程中回收的H 3 PO 4为85重量%,而Al泄漏的浓度为3.68mg / kg。尽管扩散渗析对于该目的非常有效,但未能实现多目标,同时具有50%的酸浓度和少于1 mg Al / kg的85%H3PO4的H3PO4回收率。通过在730 mm Hg的真空压力和125°C的温度下进行真空蒸馏,可以将HNO3和HAc与H3PO4完全分离。

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