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Measurement and comparison of silicon p-i-n-photodiodes with ac impedance at different voltages

机译:在不同电压下具有交流阻抗的p-i-n硅光电二极管的测量和比较

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摘要

The dark alternating current (ac) parameters of commercially available silicon p-i-n-photodiodes are measured and compared at room temperature both in forward and reverse bias using the impedance spectroscopy technique. The ac behavior of the photodiodes is found to be almost the same. For bias voltages in the range from -0.8 to 0.0 V, the typical photodiode behaves like a pure capacitor. For higher voltages (V >-0.2 V) the impedance spectra are nearly semicircular and typically distorted on the high frequency side. At 0.2 V the distortion apparently arises from one of the two interfaces. However, at high bias voltages the nature of the distortion is attributed to the variation of photodiode capacitance and resistance with measurement frequency.
机译:在室温下,使用阻抗谱技术测量并比较市售硅p-i-n-光电二极管的暗交流电(ac)参数。发现光电二极管的交流行为几乎相同。对于-0.8至0.0 V范围内的偏置电压,典型的光电二极管的行为类似于纯电容器。对于更高的电压(V> -0.2 V),阻抗谱几乎为半圆形,并且通常在高频侧失真。在0.2 V时,失真显然是由两个接口之一引起的。但是,在高偏置电压下,失真的性质归因于光电二极管电容和电阻随测量频率的变化。

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