...
首页> 外文期刊>Sensors and Actuators, A. Physical >All polarization properties of PLZT ferroelectric ceramics observed in two dimensional distributions under applied voltage by the Mueller matrix
【24h】

All polarization properties of PLZT ferroelectric ceramics observed in two dimensional distributions under applied voltage by the Mueller matrix

机译:用穆勒矩阵在施加电压的二维分布中观察到PLZT铁电陶瓷的所有极化特性

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

This paper describes spatial distributions of all polarization properties of anti-ferroelectric PLZT-8.9/65/35 (lead lanthanum zirconate titanate) ceramics as a function of the applied voltage. The application of PLZT in optical devices requires an understanding of the distributions of its optical characteristics. However, birefringence measurement, which is a general method for observing the distribution of optical characteristics, is not useful for the evaluation of other polarization properties. For the quantitative measurement of all of the polarization properties, therefore, we focused on the Mueller matrix, which describes all of the polarization properties. Initially, in order to evaluate the optical characteristics of PLZT for optical devices that are not based on the spatial distributions of the polarization properties, all of the integral polarization properties, which are the averages of each polarization property, were measured using a dual-rotating retarder polarimeter. These results were then used to valuate the significance of the polarization property distributions measured using the polarimeter combined with a microscope, which enabled detection of the spatial distributions of the Mueller matrix. We have observed that birefringence indicates the distributions that depend on the grain structure. With increasing voltage, the birefringence is oriented by the external electric field. Thus, a reduction of the variation in the birefringence can be achieved by maintaining direction of the electrical polarization, and this reduction causes a decrease in the depolarization. These measurements are useful for revealing the optical behavior of ferroelectric ceramics, and provide helpful information for the development of optical devices.
机译:本文描述了反铁电PLZT-8.9 / 65/35(锆钛酸镧镧)陶瓷的所有极化特性的空间分布随施加电压的变化。 PLZT在光学设备中的应用需要了解其光学特性的分布。然而,双折射测量是用于观察光学特性的分布的通用方法,对于评估其他偏振特性没有用。因此,对于所有偏振特性的定量测量,我们集中于描述所有偏振特性的穆勒矩阵。最初,为了评估不基于偏振特性空间分布的光学设备的PLZT光学特性,使用双旋转测量所有积分偏振特性,即每个偏振特性的平均值。延迟器旋光仪。然后将这些结果用于评估使用偏振计和显微镜组合测得的偏振特性分布的重要性,这可以检测Mueller矩阵的空间分布。我们已经观察到双折射表明取决于晶粒结构的分布。随着电压的增加,双折射由外部电场定向。因此,可以通过保持电偏振的方向来减小双折射的变化,并且这种减小导致去偏振的减小。这些测量对于揭示铁电陶瓷的光学性能很有用,并为光学器件的开发提供有用的信息。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号