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Low programming input, direct overwrite and synchronous phase-change random access memory (SPRAM)

机译:低编程输入,直接覆盖和同步相变随机存取存储器(SPRAM)

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摘要

The programming inputs for phase-change random access memories (PRAMs) can be significantly reduced by using voltage pulse for RESET (V_(reset)) and current pulse for SET (I_(set)) for different structures. Based upon two-dimensional electrothermal simulations, the PRAM cells can be operated by V_(reset) and I_(set) pulses of 50 ns at amplitudes as low as 0.27 V and 35 mu A, respectively. The direct overwrite function can be achieved under this mode, and extra asynchronous suspending circuits are not needed.
机译:通过将电压脉冲用于RESET(V_(reset)),将电流脉冲用于SET(I_(set)),可以显着减少相变随机存取存储器(PRAM)的编程输入。基于二维电热模拟,PRAM单元可以通过50 ns的V_(复位)和I_(设置)脉冲以低至0.27 V和35μA的幅度工作。在这种模式下可以实现直接覆盖功能,并且不需要额外的异步挂起电路。

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