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Structural and dielectric properties of A- and B-sites doped CaCu3Ti4O12 ceramics

机译:A位和B位掺杂CaCu3Ti4O12陶瓷的结构和介电性能

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The effect of doping the A site (Ca) with La and B site (Ti) with Nb, on the grain formation, crystallographic structure, electrical properties and dielectric behaviour of CaCu3Ti4O12 is investigated over wide ranges of temperature (27-150 degrees C) and frequency (50 Hz to 5 MHz). Microstructure investigation of the cast compound, Ca(1-3x)La2xCu3Ti(4-5x)Nb4xO12 (x=0, 0.02 and 0.04), using Scanning Electron Microscopy (SEM) showed that co-doping would result in grain growth inhibition. Rietveld refinement of the powder diffraction data confirmed a cubic, single phase structure with space group Im3. The steady increase in the lattice volume with increasing dopant concentration confirms the incorporation of the bigger dopant molecules in the lattice. Dielectric studies using HIOICI 3552-50 LCR Hi-Tester show that the room temperature dielectric constant would considerably increase due to co-doping. Impedance spectroscopic studies reveal that the compound is electrically heterogeneous, with semi conductive grain interior and insulating grain boundaries. Doping resulted in a decrease in grain boundary resistance and consequent increase in dielectric loss at low frequency. The dielectric behaviour of compound is explained on the basis of the Internal Barrier Layer Capacitance (JBLC) model. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
机译:研究了在宽温度范围(27-150摄氏度)下,在La的A部位(Ca)和Nb掺杂的B部位(Ti)对CaCu3Ti4O12的晶粒形成,晶体结构,电性能和介电性能的影响。和频率(50 Hz至5 MHz)。使用扫描电子显微镜(SEM)对铸造化合物Ca(1-3x)La2xCu3Ti(4-5x)Nb4xO12(x = 0、0.02和0.04)的微观结构研究表明,共掺杂会导致晶粒生长受到抑制。粉末衍射数据的Rietveld改进证实了具有空间群Im3的立方单相结构。随着掺杂剂浓度的增加,晶格体积的稳定增加证实了较大的掺杂剂分子在晶格中的结合。使用HIOICI 3552-50 LCR Hi-Tester进行的介电研究表明,由于共掺杂,室温介电常数会大大提高。阻抗谱研究表明,该化合物是异质的,具有半导电的晶粒内部和绝缘的晶界。掺杂导致晶界电阻降低,从而导致低频下的介电损耗增加。根据内部阻挡层电容(JBLC)模型来解释化合物的介电性能。 (C)2015 Elsevier Ltd和Techna Group S.r.l.版权所有。

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