Method of Optical Near-Field Microscopy of Foreign Atoms on the Surface of Nonabsorbing Dielectrics upon Brewster Reflection of Light

摘要

It is shown that, by means of measuring the frequency dependence of the ellipticity of light reflected at the Brewster angle from the plane surface of a nonabsorbing dielectric, one can reveal on it nanostructural objects consisting of foreign atoms or molecules. They manifest themselves by the presence of size resonances, arising in these structures in a field of optical radiation because of the dipole–dipole interaction of the atoms (molecules). A theoretical justification of the experimental technique that takes into account the presence of a transition layer on the surface of the dielectric is proposed.