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Stark spectroscopy of CuPc organic semiconductor with a submicron metal-electrode grating

机译:亚微米金属电极光栅对CuPc有机半导体的鲜明光谱

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The optical and electro-optical properties of organic copper phthalocyanine semiconductor (alpha- CuPc) have been investigated by Stark (electroabsorption) spectroscopy using a metal electrode grating with a submicron (0.88 mu m) interelectrode distance. Differences between dipole moments (Delta mu) and polarizabilities (Delta alpha) in the excited and ground states of alpha-CuPc are measured for a nanoscale semiconductor film. It is concluded that the extremely high values of Delta mu and Delta alpha are in principle not parameters of individual alpha-CuPc molecules: they are determined by exciton effects specifically in the polycrystalline medium with a characteristic morphology of hyperfine films, which depends on the structure of the samples and their fabrication technology.
机译:使用具有亚微米(0.88微米)电极间距的金属电极光栅,通过Stark(电吸收)光谱法研究了有机铜酞菁半导体(α-CuPc)的光学和电光学性质。对于纳米级半导体膜,测量了α-CuPc的激发态和基态中的偶极矩(Delta mu)和极化率(Delta alpha)之间的差异。结论是,Δmu和Deltaα的极高值原则上不是单个α-CuPc分子的参数:它们是由激子效应确定的,特别是在具有超细薄膜特征形态的多晶介质中,这取决于结构样品及其制造技术。

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