Empirical parameterization of CR-39 longitudinal track depth

摘要

In this work, new empirical equation describing the charged particles radiation track development against etching time and track longitudinal depth are presented. The equation involves four free fitting parameters. It is shown that this equation can reproduce tracks depth formed on the CR-39 by alpha particles at different energies and etching times. Parameters values obtained from experimental data can be used to predict etched track lengths at different energies and etching times. The empirical equation suggested is self consistent as far as reproducing all features of track depth development as a function of etching time and energy are concerned.