...
首页> 外文期刊>Radiation measurements >Reduction in etching time for fission tracks in diallyl phthalate resin
【24h】

Reduction in etching time for fission tracks in diallyl phthalate resin

机译:减少邻苯二甲酸二烯丙酯树脂中裂变径迹的蚀刻时间

获取原文
获取原文并翻译 | 示例

摘要

Diallyl phthalate (DAP) resin plates were irradiated with fission fragments, and then etched in a conventional aqueous solution of KOH or a PEW solution containing ethanol, water and KOH. Etched tracks were observed and counted by using an optical microscope. The PEW solution made the fission tracks etch-pits clearer in an incomparably shorter etching time. The large and round etch-pits developed on a smooth, surface were convenient for optical automatic counting. These etching characteristics of DAP in a PEW solution are suitable for quantitative analysis of fissionable materials and neutron dosimetry. (C) 2001 Elsevier Science Ltd. All rights reserved. [References: 5]
机译:用裂变碎片辐照邻苯二甲酸二烯丙酯(DAP)树脂板,然后在常规的KOH水溶液或含有乙醇,水和KOH的PEW溶液中进行蚀刻。使用光学显微镜观察并计数蚀刻的痕迹。 PEW解决方案以无与伦比的蚀刻时间缩短了裂变径迹的蚀刻坑。在光滑的表面上形成的大而圆形的蚀刻坑便于光学自动计数。 PEW溶液中DAP的这些刻蚀特性适用于可裂变材料的定量分析和中子剂量学。 (C)2001 Elsevier ScienceLtd。保留所有权利。 [参考:5]

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号