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Ion-pair production due to electron-impact dissociative ionization of sulfur hexafluoride molecule

机译:六氟化硫分子的电子碰撞解离电离导致的离子对产生

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摘要

Using the crossed molecular and electron beams technique and the mass-spectrometric analysis of the reaction products,electron-impact dissociative ionization of the sulfur hexafluoride (SF_6)molecule was studied within the incident electron energy range from threshold up to 150 eV.The simultaneous production of the ion fragment pair SF_3~+,F~+was observed confirming the mechanism of intermediate doubly charged SF_4~(2+)ion formation suggested earlier by several authors.The relative dissociative ionization cross sections were normalized to the absolute scale using known experimental data.
机译:使用交叉分子和电子束技术以及反应产物的质谱分析,研究了在阈值至150 eV的入射电子能量范围内六氟化硫(SF_6)分子的电子碰撞解离电离。观察到离子片段对SF_3〜+,F〜+的存在,证实了几位作者较早提出的中间双电荷SF_4〜(2+)离子形成的机理。相对解离电离截面用已知实验归一化为绝对尺度。数据。

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