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The radiation effect on optical and morphological properties of Ag-As-Te thin films

机译:辐射对Ag-As-Te薄膜光学和形貌特性的影响

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摘要

The effect of gamma irradiation on the features of AgxAs50-xTe50 with 3 <= x <= 20 films has been studied. The studies indicated that the films partially transform from the amorphous phase to a crystalline phase at low doses of gamma irradiation (0.5-3 kGy). The radiation effect on the optical spectrum of Ag-As-Te films has been studied on the deposited films before and after each radiation dose. It is found that the calculated optical band gap (E-g) decreases with increasing Ag content and at the same time decreases with the radiation dose up to 3 kGy. Increasing the radiation dose up to 3 kGy induces an indirect transition and consequently decreases the energy gap. This behavior is associated with the generation of excess electronic localized states. The surface morphology has been investigated with a scanning electron microscope (SEM). (c) 2007 Elsevier Ltd. All rights reserved.
机译:研究了γ辐照对3 x = x <= 20薄膜的AgxAs50-xTe50的特征的影响。研究表明,在低剂量的伽马射线辐射(0.5-3 kGy)下,薄膜部分地从非晶相转变为结晶相。已经研究了在每次辐射剂量之前和之后沉积的薄膜对Ag-As-Te薄膜光谱的辐射效应。可以发现,随着Ag含量的增加,计算出的光学带隙(E-g)减小,同时随着辐射剂量的增加,直至3 kGy减小。将辐射剂量增加到3 kGy会引起间接跃迁,从而减小能隙。此行为与多余的电子局部状态的生成相关。用扫描电子显微镜(SEM)研究了表面形态。 (c)2007 Elsevier Ltd.保留所有权利。

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