Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications

摘要

In this work, a group of Lu_2SiO_5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 mm with a 6 mm thick scintillating layer.