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首页> 外文期刊>Research report NIFS-PROC series >GENERATION OF INTENSE PULSED ION BEAM AND ITS APPLICATION TO MATERIALS PROCESSING
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GENERATION OF INTENSE PULSED ION BEAM AND ITS APPLICATION TO MATERIALS PROCESSING

机译:强脉冲离子束的产生及其在材料加工中的应用

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Intense pulsed heavy ion beam is expected to be applied to materials processing including surface modification and the ion implantation. For those applications, it is very important to generate high-purity ion beams with various ion species. A magnetically insulated ion diode with an active ion source of a vacuum arc plasma gun has been developed in order to generate pulsed metallic ion beams. When the ion diode was operated at diode voltage 200 kV, diode currents 15 kA and pulse duration 100 ns, the ion beam with an ion current density of > 200 A/cm~2 was obtained at 50 mm downstream from the anode. From Thomson parabola spectrometer measurement, the ion beam consists of aluminum ions (Al~+, Al~(2+) and Al~(3+)) of energy 140-780 keV and the proton impurities of energy 170-190 keV. To evaluate the irradiation effect of the ion beam, an amorphous silicon thin film of thickness ≈ 1μm was used as the target, which was deposited on the glass substrate. By the X-ray diffraction measurement of the films before and after the irradiation, the film was found to be poly-crystallized after 5-shots of the pulsed aluminum ion beam irradiation.
机译:有望将强脉冲重离子束应用于包括表面改性和离子注入在内的材料处理。对于那些应用,生成具有各种离子种类的高纯度离子束非常重要。为了产生脉冲的金属离子束,已经开发了具有真空电弧等离子体枪的有源离子源的磁绝缘离子二极管。当离子二极管在200 kV的二极管电压,15 kA的二极管电流和100 ns的脉冲持续时间下工作时,在阳极下游50 mm处获得离子电流密度> 200 A / cm〜2的离子束。通过Thomson抛物线光谱仪的测量,离子束由能量为140-780 keV的铝离子(Al〜+,Al〜(2+)和Al〜(3+))和能量为170-190 keV的质子杂质组成。为了评估离子束的照射效果,将厚度约1μm的非晶硅薄膜用作目标,并将其沉积在玻璃基板上。通过辐照前后的膜的X射线衍射测量,发现在脉冲铝离子束辐照5次之后,该膜是多晶的。

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