Electron interactions with the focused electron beam induced processing (FEBID) precursor tungsten hexachloride

摘要

RationaleSecondary electrons with an energy distribution below 100 eV are formed when high-energy particles interact with matter. In the focused electron beam induced deposition, high-energy beams are used to decompose organometallic compounds on surfaces. We investigated the electron ionisation of WCl6 and dissociative electron attachment to WCl6 in the gas phase in order to better understand the decomposition mechanism driven by secondary electrons.