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High-performance photodetector based on an interface engineering-assisted graphene/silicon Schottky junction

机译:基于界面工程辅助石墨烯/硅肖特基结的高性能光电探测器

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Graphene/silicon Schottky junctions have been proven efficient for photodetection, but the existing high dark current seriously restricts applications such as weak signal detection. In this paper, a thin layer of gadolinium iron garnet (Gd3Fe5O12, GdIG) film is introduced to engineer the interface of a graphene/silicon Schottky photodetector. The novel structure shows a significant decrease in dark current by 54 times at a -2 V bias. It also exhibits high performance in a self-powered mode in terms of an I-light/I-dark ratio up to 8.2 x 10(6) and a specific detectivity of 1.35 x 10(13) Jones at 633 nm, showing appealing potential for weak-light detection. Practical suitability characterizations reveal a broadband absorption covering ultraviolet to near-infrared light and a large linear response with a wide range of light intensities. The device holds an operation speed of 0.15 ms, a stable response for 500 continuous working cycles, and long-term environmental stability after several months. Theoretical analysis shows that the interlayer increases the barrier height and passivates the contact surface so that the dark current is suppressed. This work demonstrates the good capacity of GdIG thin films as interlayer materials and provides a new solution for high-performance photodetectors.
机译:石墨烯/硅肖特基结已被证明可用于光探测,但现有的高暗电流严重限制了弱信号检测等应用。本文介绍了一层薄薄的钆铁石榴石(Gd3Fe5O12,GdIG)薄膜,以设计石墨烯/硅肖特基光电探测器的界面。这种新结构显示,在-2 V偏置下,暗电流显著降低了54倍。它还在自供电模式下表现出高性能,工字/工字暗比高达 8.2 x 10(6),在 633 nm 处的比检测率为 1.35 x 10(13) Jones,显示出极具吸引力的弱光检测潜力。实际适用性表征揭示了覆盖紫外到近红外光的宽带吸收,以及在很宽的光强度范围内具有较大的线性响应。该器件的工作速度为0.15 ms,连续工作循环500次的稳定响应,数月后长期保持环境稳定。理论分析表明,夹层增加了势垒高度,钝化了接触面,从而抑制了暗电流。这项工作证明了GdIG薄膜作为夹层材料的良好容量,为高性能光电探测器提供了新的解决方案。

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