Simultaneous detection of optical retardation and axis orientation by polarization-sensitive full-field optical coherence microscopy for material testing

摘要

We present a polarization-sensitive full-field optical coherence microscopy modality which is capable of simultaneously delivering depth resolved information on the reflectivity, optical retardation and optical axis orientation. In this way local birefringence, inherent stress-strain fields and optical anisotropies can be visualized with high resolution, as exemplified for various technical material applications.