机译:基于X射线光电子能谱和电子亲和规律的ZnO/Ga2O3和Ta2O5/Ga2O3异质界面的能带排列
Beijing Univ Posts & Telecommun, Sch Sci, Lab Informat Funct Mat & Devices, Beijing 100876, Peoples R China;
Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China;
Chongqing Normal Univ, Coll Phys & Elect Engn, Chongqing 401331, Peoples R China;
机译:X-ray photoelectron spectroscopy study of Al/Ta2O5 and Ta2O5/Al buried interfaces
机译:Growth and structure of thin platinum films deposited on Co(0001) studied by low-energy electron diffraction, X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy and scanning tunneling microscopy
机译:Electron transport processes in reflection electron energy loss spectroscopy (REELS) and X-ray photoelectron spectroscopy (XPS)
机译:Al2O3-MXOY -TA2O5(MXOY = NB2O5,GA2O3,Y2O3)玻璃的合成与机械性能
机译:基于层状Ga2O3(ZnO)m的热电应用同源化合物
机译:原子层沉积ZnO /β-Ga2O3(...公式...)异质结的能带研究
机译:通过X射线光电子光谱和电子亲和规则在ZnO / Ga2O3和Ta2O5 / Ga2O3异煤具有能带对准
机译:Ga2O3纳米线上平行取向ZnO纳米结构阵列的可控生长