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机译:
机译:Determination of residual stresses in Pb(Zr_(0.53)Ti_(0.47))O_(3) thin films with Raman spectroscopy
机译:Gas exposure and thermal stability of linear carbon chains in nanostructured carbon films investigated by in situ Raman spectroscopy
机译:In situ study of the effect of temperature on the electronic structure of Ni_(x)Mn_(3-x)O_(4+δ) thin films using scanning tunneling spectroscopy
机译:p-Type Transparent Amorphous Oxide Thin-Film Transistors Using Low-Temperature Solution-Processed Nickel Oxide
机译:Thermal crystallization kinetic and electrical properties of partly crystallized amorphous indium oxide thin films sputtering deposited in the presence or the absence of water vapor