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Electrical and optical properties of hydrogenated RNi_5/Co (R = Ce, La) bi-layer systems

机译:氢化 RNi_5/Co (R = Ce, La) 双层体系的电学和光学特性

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摘要

The hydrogenation behaviour of RNi_5/Co (R = Ce, La) bi-layer thin films has been investigated. To prevent the poisoning of surface of thin films due to the gases like O_2, CO_2, etc. the films were well coated by a thin over layer of cobalt because of its resistance to oxidation. Thin film samples were characterized by means of XRD. In order to investigate the effect of hydrogen on the surface structure of the film, the optical micrograph and transmission spectra of as deposited and hydrogenated thin film samples have been carried out. It can be concluded from the transmittance spectra that the hydrogenation of the film causing an increment in the transmission. Thin metallic films switch reversibly from their initial reflecting state to visually transparent states when exposed to gaseous hydrogen. It has also been confirmed from the change in optical micrographs of the films. It has been found that the resistance of film increases with the absorption of hydrogen. The resistance of the same decreases with desorption of hydrogen. The effect of temperature and hydrogen exposing time on the resistance of the film has also been studied.
机译:研究了RNi_5/Co (R = Ce, La) 双层薄膜的加氢行为.为了防止薄膜表面因O_2、CO_2等气体而中毒,由于薄膜的抗氧化性,薄膜被一层薄薄的钴覆盖。通过XRD对薄膜样品进行表征。为了研究氢气对薄膜表面结构的影响,对沉积和氢化薄膜样品进行了光学显微照片和透射光谱分析。从透射率光谱可以得出结论,薄膜的氢化导致透射率增加。当暴露于气态氢时,金属薄膜会从其初始反射状态可逆地切换到视觉透明状态。从胶片光学显微照片的变化也证实了这一点。研究发现,薄膜的电阻随着氢气的吸收而增加。其电阻随着氢的解吸而降低。还研究了温度和氢气暴露时间对薄膜电阻的影响。

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