Specular and off-specular polarized neutron reflectivity at Dhruva

摘要

A rapidly increasing number of research and applications in science and engineering rely on thin films and multilayers down to the sub-nanometer scale. In order to understand the magnetic properties of interfaces in nano-structures, detailed structural and magnetic characterization as well as their correlation is required. Polarized neutron reflectivity (PNR) and X-ray reflectivity (XRR) are two nondestructive techniques that provide quantitative measures of the physical and magnetic depth profiles in films with better than nanometer resolution [1-5].