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Device for measuring of the polarized neutron reflectivity using two polarized neutron super-mirrors

机译:使用两个极化中子超镜测量极化中子反射率的装置

摘要

The present invention relates to a polarized neutron reflectometry apparatus using the two polarized neutron second mirror, neutron induction tube that guides the neutrons from the neutron source; A monochromator Monochromator neutrons emitted from the neutron induced tube; Is in the single color group from the neutron beam monochromator comprising the spin-up and spin-down neutrons having a specific wavelength, using a second polarized neutron second mirror for reflecting the first polarized neutrons and a second mirror that reflects the spin-up neutron spin down neutrons , a selector for determining a spin-spin form which is incident on the sample; Is selected from the neutron spin selector reduces the line width of a spin-out slit form to be incident on the sample; Analyzer using the second mirror to reflect or transmit according to spin form a neutron beam which is reflected from the sample; And the sample analyzer detects the neutron and the neutron transmitted through the transmission or reflection, and by measuring the reflectance of the detector; Provides a polarized neutron reflectometry apparatus comprising a. ; According to the present invention having a configuration as Thus, the structure of the polarized neutron reflectivity device becomes simple, the operation is simplified so that the effect is.
机译:本发明涉及一种使用两个偏振中子第二反射镜的偏振中子反射仪,该中子感应管引导来自中子源的中子。单色仪从中子感应管发射的单色仪中子;是来自中子束单色仪的单色组,该中子束单色仪包括具有特定波长的向上旋转和向下旋转的中子,使用第二偏振中子第二反射镜反射第一偏振中子,第二反射镜反射向上旋转的中子旋转中子,一种用于确定入射在样品上的自旋自旋形式的选择器;从中子自旋选择器中选择,可减小入射到样品上的自旋裂隙形式的线宽;分析仪使用第二反射镜根据自旋反射或透射形成从样品反射的中子束;并且样品分析仪检测中子和通过透射或反射传输的中子,并通过测量检测器的反射率;提供一种偏振中子反射仪,包括: ;根据具有这样的构造的本发明。因此,偏振中子反射率装置的结构变得简单,操作被简化从而达到效果。

著录项

  • 公开/公告号KR100636794B1

    专利类型

  • 公开/公告日2006-10-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20040051695

  • 发明设计人 조상진;이창희;김영진;

    申请日2004-07-02

  • 分类号G01N23/05;

  • 国家 KR

  • 入库时间 2022-08-21 21:22:45

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