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High-performing nonlinear visualization of terahertz radiation on a silicon charge-coupled device

机译:硅电荷耦合器件上太赫兹辐射的高性能非线性可视化

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Photoinduced electron transitions can lead to significant changes of the macroscopic electronic properties in semiconductors. This principle is responsible for the detection of light with charge-coupled devices. Their spectral sensitivity is limited by the semiconductor bandgap which has restricted their visualization capabilities to the optical, ultraviolet, and X-ray regimes. The absence of an imaging device in the low frequency terahertz range has severely hampered the advance of terahertz imaging applications in the past. Here we introduce a high-performing imaging concept to the terahertz range. On the basis of a silicon charge-coupled device we visualize 5-13 THz radiation with photon energy under 2% of the sensor's band-gap energy. The unprecedented small pitch and large number of pixels allow the visualization of complex terahertz radiation patterns in real time and with high spatial detail. This advance will have a great impact on a wide range of terahertz imaging disciplines.
机译:光诱导的电子跃迁可以导致半导体中宏观电子性质的显着变化。该原理负责使用电荷耦合器件检测光。它们的光谱灵敏度受到半导体带隙的限制,半导体带隙将它们的可视化能力限制在光学,紫外线和X射线范围内。过去,在低频太赫兹范围内缺少成像设备已严重阻碍了太赫兹成像应用的发展。在这里,我们向太赫兹范围介绍高性能成像概念。在硅电荷耦合器件的基础上,我们可以看到5-13 THz的辐射,其光子能量低于传感器的带隙能量的2%。前所未有的小间距和大量像素,可实时,高空间细节地显示复杂的太赫兹辐射图。这一进步将对多种太赫兹成像学科产生重大影响。

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