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Biexciton and exciton dynamics in single InGaN quantum dots

机译:单个InGaN量子点中的双激子和激子动力学

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摘要

Time-resolved and time-integrated microphotoluminescence spectrometry of exciton and biexciton transitions in a single self-assembled InGaN quantum dot gives sharp peaks, with the biexciton 41 meV higher in energy. Theoretical modelling in the Hartree approximation (using a self-consistent finite difference method) predicts a splitting of up to 51 meV. Time-resolved microphotoluminescence measurements yield a radiative recombination lifetime of 1.0 + - 0.1 ns for the exciton and 1.4 + - 0.1 ns for the biexciton. The data can be fitted to a coupled DE rate equation model, confirming that the exciton state is refilled as biexcitons undergo radiative decay.
机译:单个自组装InGaN量子点中激子和双激子跃迁的时间分辨和时间积分微光致发光光谱给出了尖峰,双激子的能量高41 meV。 Hartree近似中的理论建模(使用自洽有限差分法)可预测高达51 meV的分裂。时间分辨的微光致发光测量得出激子的辐射复合寿命为1.0 +-0.1 ns,双激子为1.4 +-0.1 ns。可以将数据拟合到耦合的DE速率方程模型,从而确认激子状态在双激子经历辐射衰减时被重新填充。

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