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首页> 外文期刊>Nanotechnology >Controlled growth of core-shell Si-SiO_x and amorphous SiO_2 nanowires directly from NiO/Si
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Controlled growth of core-shell Si-SiO_x and amorphous SiO_2 nanowires directly from NiO/Si

机译:直接从NiO / Si受控生长核-壳Si-SiO_x和非晶SiO_2纳米线

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A simple, direct synthesis method is used to grow core-shell Si-SiO_x and amorphous SiO_2 nanowires by heating a NiO-catalyzed silicon substrate. The morphology of the nanowires was controlled by carbothermal reduction of WO_3, which provides a reductive environment to synthesize crystalline Si nanowires covered with a SiO_x sheath at the growth temperature of 1000-1100 deg C. Only amorphous SiO_2 nanowires were produced when the substrate was annealed without using WO_3/C. Transmission electron microscopy shows that the Si core is 20-50 nm in diameter and the SiO_x shell layer is 40-60 nm thick. After hydrofluoric acid (HF) treatment of core-shell Si-SiO_x, the single-crystalline silicon nanowires (SiNWs) were obtained in large quantities. The HF-treated SiNWs were 20-50 nm in diameter. The main crystal growth direction of the SiNWs was [111]. The nanowires grown were highly pure (no metal catalyst contamination) and very long (hundreds of micrometres). A solid-liquid-solid (SLS) mechanism is proposed for the growth of both core-shell Si-SiO_x and amorphous SiO_2 nanowires.
机译:通过加热NiO催化的硅衬底,使用一种简单的直接合成方法来生长核-壳Si-SiO_x和非晶SiO_2纳米线。通过碳热还原WO_3来控制纳米线的形貌,这为在1000-1100摄氏度的生长温度下合成覆盖有SiO_x鞘的结晶Si纳米线提供了还原环境。当基板退火时,仅产生非晶SiO_2纳米线。无需使用WO_3 / C。透射电子显微镜表明,Si核的直径为20-50nm,SiO_x壳层的厚度为40-60nm。经过氢氟酸(HF)处理的核壳Si-SiO_x,大量获得了单晶硅纳米线(SiNWs)。经HF处理的SiNW直径为20-50nm。 SiNWs的主要晶体生长方向为[111]。生长的纳米线是高纯度的(无金属催化剂污染)并且非常长(数百微米)。提出了固-液-固(SLS)机理,用于芯-壳Si-SiO_x和非晶SiO_2纳米线的生长。

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