首页> 外文期刊>Nanotechnology >Department of Electrical and Computer Engineering and Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
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Department of Electrical and Computer Engineering and Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA

机译:伊利诺伊大学厄本那-香槟分校电气与计算机工程系和贝克曼先进科学技术学院,美国伊利诺伊州61801

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摘要

Ultrahigh vacuum (UHV) scanning tunnelling microscopy (STM) and spectroscopy (STS) have been used to examine the role of substrate doping and composition in determining the electronic behaviour of semiconducting single-walled carbon nanotubes (SWNT) deposited onto III-V(110) surfaces. Hybrid SWNT/III-V(110) systems were created through sample cleavage and subsequent nanotube transfer in UHV. Room temperature STS spectra indicate electron transfer from the n-GaAs substrate to the supported SWNT and from the SWNT to the p-GaAs substrate, resulting in the respective n-type and p-type doping of the nanotube upon adsorption. STS measurements on InAs(110) supported carbon nanotubes are less uniform, with selected SWNTs on the n-InAs(l10) surface exhibiting distinct electronic changes when shifted into registration with the substrate lattice. No such orientation sensitivity is detected in nanotubes on GaAs surfaces. The potential for systematic modification of a SWNT's electronic behaviour through intentional substrate engineering could present a new avenue for the design and fabrication of nanotube-based device structures.
机译:超高真空(UHV)扫描隧道显微镜(STM)和光谱(STS)已用于检查衬底掺杂和成分在确定沉积在III-V上的半导体单壁碳纳米管(SWNT)的电子性能方面的作用(110) )表面。混合SWNT / III-V(110)系统是通过样品切割和随后在超高压中的纳米管转移而创建的。室温STS光谱表明电子从n-GaAs衬底转移到负载的SWNT以及从SWNT转移到p-GaAs衬底,导致纳米管在吸附时分别发生n型和p型掺杂。 InAs(110)负载的碳纳米管上的STS测量不太均匀,当移入与衬底晶格对齐时,n-InAs(110)表面上的选定SWNT表现出明显的电子变化。在GaAs表面的纳米管中未检测到这种取向敏感性。通过有意的衬底工程来系统地修改SWNT的电子行为的潜力,可以为基于纳米管的器件结构的设计和制造提供一条新途径。

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