Influence of substrate microstructure on longitudinal correlation length of porous system of anodic alumina: Small-angle scattering study

摘要

Three series of anodic alumina membranes have been studied using the small-angle diffraction of neutrons and synchrotron radiation. The samples are obtained by the oxidation of aluminum wafers by sulfuric and oxalic acids at various anodization voltages and differences in the distance between the pores. Using experiments on small-angle diffraction, a linear dependence between the average grain size of an initial aluminum wafer and the average rectilinearity of pores of the synthesized membranes is established. We suggest that the observed correlation is caused by the influence of the crystallographic orientation of grains of an initial aluminum wafer on the growth of a porous oxide film.