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首页> 外文期刊>Nanotechnology >Topological analysis of Au particles in Au/SiO2 nanocomposite films designed for molecular conduction measurement through Voronoi diagram
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Topological analysis of Au particles in Au/SiO2 nanocomposite films designed for molecular conduction measurement through Voronoi diagram

机译:通过Voronoi图设计用于分子传导测量的Au / SiO2纳米复合薄膜中Au粒子的拓扑分析

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Monolayered Au/SiO2 nanocomposite films with a high Au particle number density and insulating property were prepared by radio frequency magnetron co-sputtering to develop a new substrate for molecular conduction measurement. The topologies of Au nanoparticles distributed in the SiO2 matrix were statistically evaluated by morphology observation using a field emission scanning electron microscope (FE-SEM) and the Voronoi diagram of a circle set by regarding the Au nanoparticles as a circle generator. The mean Au particle size and the interparticle distance between neighbours increased with deposition time. However, the fraction of the neighbouring Au nanoparticle combinations having interparticle distance shorter than a certain length increased as the deposition time increased. The results also demonstrated that many conducting paths several tens of nanometres long can be created by attaching conductive molecules 2.4 nm long between the Au nanoparticle combinations. Thus this suggests that the nanocomposite substrate can provide a facile way to measure conducting properties of molecules.
机译:通过射频磁控共溅射制备了具有高Au颗粒数密度和绝缘性能的单层Au / SiO2纳米复合薄膜,为分子导电测量提供了一种新的基板。通过使用场发射扫描电子显微镜(FE-SEM)的形态观察和通过将Au纳米颗粒视为圆发生器而形成的圆的Voronoi图,对分布在SiO 2基质中的Au纳米颗粒的拓扑进行统计学评估。金的平均粒径和相邻粒子之间的距离随着沉积时间的增加而增加。然而,随着沉积时间的增加,具有小于一定长度的粒子间距离的相邻Au纳米粒子组合的分数增加。结果还表明,通过在Au纳米粒子组合之间附着2.4nm长的导电分子,可以产生数十纳米长的许多导电路径。因此,这表明纳米复合材料基底可以提供一种简便的方法来测量分子的导电性能。

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