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Reversible Defect Engineering of Single-Walled Carbon Nanotubes Using Scanning Tunneling Microscopy

机译:使用扫描隧道显微镜的单壁碳纳米管的可逆缺陷工程

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The experimental creation and annihilation of defects on single-walled carbon nanotubes (SWCNT) with the tip of a scanning tunneling microscope are reported.The technique used to manipulate the wall structure of a nanotube at the atomic scale consists of a voltage ramp applied at constant tunneling current between the tip and the nanotube adsorbed on a gold substrate.While topographic images show an interference pattern at the defect position,spatially resolved tunneling spectroscopy reveals the presence of localized states in the band gap of the nanotube.Removal of the defect by the same procedure demonstrates the reversibility of the process.Such a precise control in the local modification of the nanotube wall opens up new opportunities to tailor SWCNT electronic properties at will.
机译:报道了用扫描隧道显微镜的尖端在单壁碳纳米管(SWCNT)上进行实验创建和消除缺陷的过程。在原子尺度上操纵纳米管壁结构的技术包括恒定施加的电压斜坡尖端图像和吸附在金基底上的纳米管之间的隧道电流。虽然形貌图显示了缺陷位置处的干涉图案,但空间分辨隧道光谱显示纳米管的带隙中存在局部状态。同样的程序证明了该过程的可逆性。对纳米管壁局部改性的这种精确控制为随意定制SWCNT电子性能提供了新的机会。

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