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首页> 外文期刊>Nano letters >Anomalous pseudocapacitive behavior of a nanostructured, mixed-valent manganese oxide film for electrical energy storage
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Anomalous pseudocapacitive behavior of a nanostructured, mixed-valent manganese oxide film for electrical energy storage

机译:用于电能存储的纳米结构混合价氧化锰薄膜的异常伪电容行为

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摘要

While pseudocapacitors represent a promising option for electrical energy storage, the performance of the existing ones must be dramatically enhanced to meet todays ever-increasing demands for many emerging applications. Here we report a nanostructured, mixed-valent manganese oxide film that exhibits anomalously high specific capacitance (~2530 F/g of manganese oxide, measured at 0.61 A/g in a two-electrode configuration with loading of active materials ~0.16 mg/cm ~2) while maintaining excellent power density and cycling life. The dramatic performance enhancement is attributed to its unique mixed-valence state with porous nanoarchitecture, which may facilitate rapid mass transport and enhance surface double-layer capacitance, while promoting facile redox reactions associated with charge storage by both Mn and O sites, as suggested by in situ X-ray absorption spectroscopy (XAS) and density functional theory calculations. The new charge storage mechanisms (in addition to redox reactions of cations) may offer critical insights to rational design of a new-generation energy storage devices.
机译:尽管伪电容器是电能存储的有希望的选择,但必须大大提高现有电容器的性能,以满足当今对许多新兴应用不断增长的需求。在这里,我们报告了一种纳米结构的混合价氧化锰膜,该膜表现出异常高的比电容(〜2530 F / g氧化锰,在两电极配置下以0.61 A / g的量度,活性物质的负载量为〜0.16 mg / cm 〜2),同时保持出色的功率密度和循环寿命。性能的显着提高归因于其与多孔纳米结构的独特混合价态,这可以促进快速的质量传输并增强表面双层电容,同时促进与Mn和O位均与电荷存储相关的简便氧化还原反应,如原位X射线吸收光谱(XAS)和密度泛函理论计算。新的电荷存储机制(除了阳离子的氧化还原反应外)可能为合理设计新一代储能设备提供关键见解。

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