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首页> 外文期刊>Nano Energy >Single crystalline nitrogen-doped InP nanowires for low-voltage field-effect transistors and photodetectors on rigid silicon and flexible mica substrates
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Single crystalline nitrogen-doped InP nanowires for low-voltage field-effect transistors and photodetectors on rigid silicon and flexible mica substrates

机译:单晶氮掺杂InP纳米线,用于刚性硅和柔性云母衬底上的低压场效应晶体管和光电探测器

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Doped nanowires can exhibit improved performance compared with the un-doped ones especially in conductivity. N-doped 1nP nanowires are synthesized by chemical vapor deposition and fabricated into field effect transistors (FETs) and photodetectors on rigid silicon, flexible mica slice and polyethylene terephthalate (PET) film. Single N-doped InP nanowire FET on silicon wafer shows excellent electrical transport property and classical n-type semiconductor behavior with a high on-off ratio of 822 and a high carrier mobility of 43.6 cm(2) v(-1) s(-1), which is much higher than pure 1nP nanowire. Single N-doped 1nP nanowire photodetector on silicon wafer exhibits a fast response time and a high white light responsibility of 0.19 x 10(4) A W-1 at the bias voltage of 1.0 V. The devices are also fabricated on flexible transparent mica slice, a novel flexible substrate and PET film, which possess perfect ductility, folding endurance and preserve high performance. Furthermore, hybrid organic inorganic poly (3hexylthiophene) (P3HT): N-doped InP nanowire heterojunction photodetectors are also fabricated, showing much improved photocurrent compared with the pristine N-doped 1nP nanowire photodetectors based on different substrates. These N-doped InP nanowire devices exhibit the low power consumption, high performance and flexibility of nano-devices, which are promising for future applications requiring large-area, high speed and low-power consumption devices. (C) 2015 Elsevier Ltd. All rights reserved.
机译:与未掺杂的纳米线相比,掺杂的纳米线可以表现出更高的性能,尤其是在导电性方面。 N掺杂的1nP纳米线是通过化学气相沉积法合成的,并在刚性硅,柔性云母片和聚对苯二甲酸乙二醇酯(PET)薄膜上制成场效应晶体管(FET)和光电探测器。硅晶片上的单个N掺杂InP纳米线FET具有出色的电传输性能和经典的n型半导体性能,具有822的高开关比和43.6 cm(2)v(-1)s(-)的高载流子迁移率1),远高于纯1nP纳米线。硅晶片上的单个N掺杂1nP纳米线光电探测器在1.0 V偏置电压下显示出快速响应时间和0.19 x 10(4)A W-1的高白光响应度。这些器件还制造在柔性透明云母片上,一种新型的柔性基材和PET膜,具有出色的延展性,耐折性并保持高性能。此外,还制备了杂化有机无机聚(3-己基噻吩)(P3HT):N掺杂的InP纳米线异质结光电探测器,与基于不同衬底的原始N掺杂的1nP纳米线光电探测器相比,其光电流得到了大大改善。这些N掺杂InP纳米线器件展现了纳米器件的低功耗,高性能和灵活性,这对于需要大面积,高速和低功耗器件的未来应用是有前途的。 (C)2015 Elsevier Ltd.保留所有权利。

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