Computed Tomography for Analysis of Rubber Components1

摘要

For challenging x-ray inspection applications, the most remarkable results are obtainable by using high resolution computed tomography with a microfocus or nanofocus X-ray source. They achieve detail detectabil-ity down to 200 nanometers (0.2 microns), using different focus modes to optimize the X-ray intensity and resolution. [1]. In pursuit of high resolution images, the potential, convenience and economy of latest high resolution CT-systems can compete in many application fields with high cost and fare available synchrotron facilities. [2]